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A Study of Secondary Ion Energy Distributions During Sputtering of MIS Layer StructuresA Study of Secondary Ion Energy Distributions During Sputtering of MIS Layer StructuresStudy of defect morphology in the metal and dielectric layers of MIS structure by SIMS and SEMDesign and Delamination of Educational Administration MIS Based on WebAdvanced ballistic tolerant fuel containment tankThe effects of adverse pressure gradients on momentum and thermal structures in transitional boundary layers. Part 1: Mean quantitiesInkjet printed metal insulator semiconductor (MIS) diodes for organic and flexible electronic applicationMIS Based on the Intranet of SJTU18.5% efficient first-generation MIS inversion-layer silicon solar cellsThe truncated-pyramid MIS inversion-layer solar cell: a comprehensive analysis
